Analytical Model to Study the Unclamped Inductive Switching Failure Analysis of an LDMOS

碩士 === 亞洲大學 === 資訊工程學系碩士班 === 101 === Lateral double-diffused metal oxide semiconductor (LDMOS) transistors are widely used in smart power IC designs such as switching power supplies, drivers, amplifiers and automotive applications. To achieve a wide variety of high-voltage applications, LDMOS devic...

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Bibliographic Details
Main Author: Grama Srinath Shreyas
Other Authors: Gene Sheu
Format: Others
Language:en_US
Published: 2013
Online Access:http://ndltd.ncl.edu.tw/handle/97225368407945084610