Design of low thermal sensitivity BIST circuits for high speed DAC
博士 === 國立雲林科技大學 === 工程科技研究所博士班 === 101 === Along with the advance in consumer electronics and communication technologies, high speed data converters were applied to many applications. The data converter testing is one of the most challenging problems in the area of analog and mixed-signal testing. A...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2013
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| Online Access: | http://ndltd.ncl.edu.tw/handle/85404519105617439782 |