Independent Component Analysis approaches for process variation monitoring and Mura defect inspection in TFT-LCD manufacturing
博士 === 元智大學 === 工業工程與管理學系 === 101 === In this dissertation, two ICA-based approaches have been proposed for process monitoring of 1-D time-series data and mura detection of 2-D images in TFT-LCD manufacturing. For 1-D signal process monitoring and control, independent components (ICs) are used as so...
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| Format: | Others |
| Language: | en_US |
| Online Access: | http://ndltd.ncl.edu.tw/handle/86727915801177654540 |