Zero-One LFSR for Low Power Deterministic BIST
碩士 === 元智大學 === 資訊工程學系 === 101 === Power consumption and test data volume are two important issues in VLSI testing. BIST (Built-In Self-Test) is a kind of DFT technique, which uses embedded logic gates to detect some faults in circuits. LFSR is commonly used in low overhead BIST to generate test dat...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Online Access: | http://ndltd.ncl.edu.tw/handle/16699935816701237498 |