Applying ANN, SVM and ELM to Identify the Types of Disturbances of an SPC/EPC System
碩士 === 輔仁大學 === 統計資訊學系應用統計碩士班 === 102 === Statistical process control (SPC) charts have been widely used in industry more than eighty years. How to effectively detect out-of-control signals in order to identify assignable causes has become a very important issue. The typical SPC chart applications r...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2014
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| Online Access: | http://ndltd.ncl.edu.tw/handle/18816687158887457102 |