Applying RFID to the SECS/GEM automatic wafer coating system.

碩士 === 國立高雄應用科技大學 === 電子工程系碩士班 === 102 === The yield Improvement, sufficient throughput, and quality guarantee are the main aspects to enhance the competition ability of a company. These issues can be attained by the automation of production line. The ultimate target is the production system aut...

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Bibliographic Details
Main Authors: Tzu-Kun Hung, 洪慈堃
Other Authors: Hung-Yu Wang
Format: Others
Language:zh-TW
Published: 2014
Online Access:http://ndltd.ncl.edu.tw/handle/16109480998523970729