Applying RFID to the SECS/GEM automatic wafer coating system.
碩士 === 國立高雄應用科技大學 === 電子工程系碩士班 === 102 === The yield Improvement, sufficient throughput, and quality guarantee are the main aspects to enhance the competition ability of a company. These issues can be attained by the automation of production line. The ultimate target is the production system aut...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2014
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/16109480998523970729 |