Applying RFID to the SECS/GEM automatic wafer coating system.
碩士 === 國立高雄應用科技大學 === 電子工程系碩士班 === 102 === The yield Improvement, sufficient throughput, and quality guarantee are the main aspects to enhance the competition ability of a company. These issues can be attained by the automation of production line. The ultimate target is the production system aut...
Main Authors: | Tzu-Kun Hung, 洪慈堃 |
---|---|
Other Authors: | Hung-Yu Wang |
Format: | Others |
Language: | zh-TW |
Published: |
2014
|
Online Access: | http://ndltd.ncl.edu.tw/handle/16109480998523970729 |
Similar Items
-
Semiconductor Communication Protocol SECS/GEM Applied to Traditional Integrated Vertical Manufacturing Systems in Taiwan
by: Guo-Shin Zhang, et al.
Published: (2018) -
A Retrofit of Semiconductor Equipment Using SECS/GEM
by: Wen-Jung Chang, et al.
Published: (2007) -
The study on applying RFID to the MES for wafer testing industry.
by: Yen-Ching Fang, et al.
Published: (2010) -
To GEM or not to GEM?
by: Charlene Huang, et al. -
The RFID Applications for Wafer Testing Automation Process
by: Li Tai, et al.
Published: (2015)