An Operational Amplifier Testing Scheme Using Digital Delay Element
碩士 === 國立高雄應用科技大學 === 電子工程系碩士班 === 102 === In this thesis, we firstly design a fully differential operational amplifier (op amp) and then propose a design for testability (DFT) applied to the embedded op amp of the sample and hold and Multiply-by-Two circuit. In the testing mode, the op amp device u...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2014
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| Online Access: | http://ndltd.ncl.edu.tw/handle/764e47 |