The Semiconductor Test Environment Detection Application with Time Domain Reflectometry
碩士 === 國立高雄應用科技大學 === 機械與精密工程研究所 === 102 === When the wafer testing. shall make the testing environment setting required about tester, load board, prober card, pogo tower and prober... all of interface assembled together, then tester will send out an electromagnetic signal. When signal pass to these...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2014
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| Online Access: | http://ndltd.ncl.edu.tw/handle/s524ub |