Parameter Abstract Using Model Validation Associated with Electronic Performances of FinFET Devices and Embedded System of Carbon Dioxide Monitoring
碩士 === 明新科技大學 === 電子工程研究所 === 102 === Semiconductor industry is overwhelmingly successful and progressive, especially from 0.1 micron devices to 20 nanometers devices. The scale decreasing of transistors results in the density of transistors such that it does not only lower the production cost b...
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| Format: | Others |
| Language: | zh-TW |
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2014
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| Online Access: | http://ndltd.ncl.edu.tw/handle/65649172443003653588 |