Structural and Optical Characterization of GaN deposited on (111) Si using Er2O3/Gd2O3 buffer layer
碩士 === 國立中興大學 === 物理學系所 === 102 === The structural and optical characteristics of GaN film deposited on Er2O3/Gd2O3-coated (111) Si were studied using double-crystal x-ray rocking curve (DCXRC), high resolution transmission electron microscopy (HRTEM) and photoluminescence (PL) spectroscopy in this...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2014
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| Online Access: | http://ndltd.ncl.edu.tw/handle/67795984819949776895 |