Defect Detection and Classification for TFT-LCD Array Process
碩士 === 國立勤益科技大學 === 資訊工程系 === 102 === The thesis integrates the Way of Quick Grabbing Defect and High-accuracy Defect Classification to examine TFT-LCD Array Manufacturing Process Defect Classification. First, we get defects through Crossing Comparative Method Of Neighborhood Blocks Image, and then...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2014
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| Online Access: | http://ndltd.ncl.edu.tw/handle/54194990244159495610 |