Effect of Oxygen Plasma Treatment on Electrical and Reliability Characteristics of HfO2 Gate Dielectrics

碩士 === 國立暨南國際大學 === 電機工程學系 === 102 === In this thesis, we studied the effect of oxygen plasma treatment on electrical and reliability characteristics of HfO2 gate dielectrics. The research topics are:(1) Effect of the post-deposition oxygen treatment;(2) Effect of the surface pre-treatment;(3) Effec...

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Bibliographic Details
Main Authors: Tian-Cih Bo, 栢添賜
Other Authors: Yi-Jung Cheng
Format: Others
Language:zh-TW
Published: 2014
Online Access:http://ndltd.ncl.edu.tw/handle/44867661576165411049