Process Integration and Development of Advanced 3D IC Key Technologies with Temporary Bonding and Bottom-Up TSV Formation

碩士 === 國立交通大學 === 電子工程學系 電子研究所 === 102 === Cost is the primary issue that limits the commercial mass production of three-dimensional integrated circuit technologies. Therefore, based on the process improvement, a set of advanced technique process flow has been proposed to achieve low cost and high t...

Full description

Bibliographic Details
Main Authors: Sun, Shimin, 孫石民
Other Authors: Chen, Kuan-Neng
Format: Others
Language:en_US
Published: 2014
Online Access:http://ndltd.ncl.edu.tw/handle/wwwd77