The relation of Vcom uniformity to the thickness variation of PI alignment layer in TFT-LCDs
碩士 === 國立交通大學 === 光電科技學程 === 102 === In this thesis, CA-210 manufactured by Konika Minolta Optics has been used to measure the color components of TFT-LCDs . By driving a TFT-LCD panel with proper waveforms, flicker variations within the panel have been minimized by using an instrument to measure th...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2013
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| Online Access: | http://ndltd.ncl.edu.tw/handle/61041742794780558965 |