A Sequential Bayesian Reliability Analysis under Gamma Step-Stress Accelerated Degradation Process

碩士 === 國立中央大學 === 統計研究所 === 102 === Degradation analysis is more efficient than the conventional life tests in drawing reliability assessment for high quality products. This thesis aims on the Bayesian approach to the degradation test when the degradation data of different products are collected und...

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Bibliographic Details
Main Authors: Cian-huei Chen, 陳芊卉
Other Authors: Tsai-hung Fan
Format: Others
Language:zh-TW
Published: 2014
Online Access:http://ndltd.ncl.edu.tw/handle/06397251085559530046