Numerical Study of Impurity Transport during Czochralski Arsenic-doped Silicon Crystal Growth

碩士 === 國立中央大學 === 機械工程學系 === 102 === Nowadays the Czochralski (Cz) technique has become a main method to grow large single silicon crystal. In order to enhance the quality of crystal, the level of oxygen concentration in the ingot as well as its electric properties has to be controlled. The optimal...

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Bibliographic Details
Main Authors: Nguyen Thi Hoai Thu, 阮氏懷秋
Other Authors: Jyh-Chen Chen
Format: Others
Language:en_US
Published: 2014
Online Access:http://ndltd.ncl.edu.tw/handle/53528976148509821912