Analysis of InN/InGaN Multiple Quantum Wells Grown by Different Methods
碩士 === 國立彰化師範大學 === 電子工程學系 === 102 === In this paper, various characterization methods have been used to compare two InN/InGaN multiple quantum well samples grown by MBE using different procedures. X-ray photoelectron spectroscopy, XPS, was used for the surface chemical composition analysis. The res...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2014
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| Online Access: | http://ndltd.ncl.edu.tw/handle/nwkgbq |