Simulation of Impact Ionization Effect in InSb High Electron Mobility Transistors

碩士 === 國立彰化師範大學 === 電子工程學系 === 102 === InSb has very high electron mobility and thus shows potential in the applications of ultra-low power, ultra-high speed electronic devices. However, the very small bandgap means strong impact ionization, which severely affects device characteristics. The purpose...

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Bibliographic Details
Main Authors: T.H.HSIEH, 謝宗羲
Other Authors: J. S. Wu
Format: Others
Language:zh-TW
Published: 2014
Online Access:http://ndltd.ncl.edu.tw/handle/hj7y63