Compact Modeling of Gate-All-Around MOSFETs

碩士 === 國立宜蘭大學 === 電子工程學系碩士班 === 102 === Following Moore's Law, CMOS transistors continue to scale. Many small-geometry effects have surfaced such as short-channel effects, limiting the device performance. In order to overcome the scaling issues, improving device gate capability is needed. Multi...

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Bibliographic Details
Main Authors: Wei-Wen Ding, 丁韋文
Other Authors: Meng-Hsueh Chiang
Format: Others
Language:zh-TW
Published: 2014
Online Access:http://ndltd.ncl.edu.tw/handle/02250983932854498799