A comparative study on Shewhart, CUSUM and EWMA attribute control charts
碩士 === 國立屏東科技大學 === 工業管理系所 === 102 === Based on literature review, when the process has a large offsets, Shewhart control chart's detect effects will better than the others. But for today's high-quality products requirement, the detect ability for large offsets has been insufficient to mee...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2014
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/57921652374201520795 |