Measuring photoreflectance spectroscopy of semiconductors by using optical fiber spectrometer
碩士 === 國立中山大學 === 物理學系研究所 === 102 === We use optical fiber spectrometer to measure the optical modulated reflectance spectroscopy (PR, Photoreflectance). Traditional optical modulation reflectance spectroscopy can be used to measure the size of the bandgap of the semiconductors, built-in electric fi...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2014
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| Online Access: | http://ndltd.ncl.edu.tw/handle/67202331448475681813 |