Chip Clustering with Mutual Information on Multiple Clock Tests and its Application to Yield Tuning

碩士 === 國立清華大學 === 電機工程學系 === 102

Bibliographic Details
Main Authors: Chiang, Jiun-Yi, 江俊毅
Other Authors: Liou, Jing-Jia
Format: Others
Language:en_US
Published: 2014
Online Access:http://ndltd.ncl.edu.tw/handle/05529026550494230966