Fin-Shape Tunnel Field-Effect Transistor Performance and Reliability Study
碩士 === 國立清華大學 === 工程與系統科學系 === 102 === The market demand for portable electric equipment increase dramatically year by year. Although transistors develop toward low cost and high density, maintaining device characteristics becomes difficult due to the device fabrication and physics limitations o...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2014
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| Online Access: | http://ndltd.ncl.edu.tw/handle/55853140138680156399 |