Study of Negative Refraction Phenomenon in Semiconductor of InSb
碩士 === 國立臺灣師範大學 === 光電科技研究所 === 102 === This thesis studies the phenomenon of negative refraction (NR) in semiconductor (InSb)-dielectric layered structures. Using the complex wave vector, we analyze the propagation direction of light energy in semiconductor-dielectric interface, and show that the d...
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2014
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/61498181530763799059 |