Error Patterns and Error Characterization for TLC NAND Flash Memory
碩士 === 國立臺北大學 === 通訊工程研究所 === 102 === In recent years, Negated AND (NAND) flash memory has been widely used as a medium for many storage systems, such as Solid State Drives (SSD). Most of NAND flash memory manufacturers scale down the manufacture process and stored more bits in each cell to lower co...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2014
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| Online Access: | http://ndltd.ncl.edu.tw/handle/89636652198074557671 |