A High-Throughput and General-Distribution Pattern Generator for Constrained Random Verification

博士 === 國立臺灣大學 === 電子工程學研究所 === 102 === Nowadays, Constrained Random Verification (CRV) methodology is becoming the mainstream to verify system-wide properties for the advantage of its scalability and efficiency. Verification engineers implement verification scenario by writing constraints instead of...

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Bibliographic Details
Main Authors: Bo-Han Wu, 吳柏翰
Other Authors: Chung-Yang Huang
Format: Others
Language:en_US
Published: 2014
Online Access:http://ndltd.ncl.edu.tw/handle/32242050746021461952