Automatic Test Pattern Generation for Delay Defects Using Timed Characteristic Functions
碩士 === 國立臺灣大學 === 電子工程學研究所 === 102 === Automatic test pattern generation (ATPG) for delay defects is an essential quality control step in integrated circuit (IC) design flow. With feature dimensions shrinking and operation frequency increasing, small changes on circuit delay may seriously affect the...
| Main Authors: | , |
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| Format: | Others |
| Language: | en_US |
| Published: |
2014
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| Online Access: | http://ndltd.ncl.edu.tw/handle/37554932868124690287 |