Based on Lissajous Hierarchical Local Scan to Realize High Speed and Large Range Atomic Force Microscopy
博士 === 國立臺灣大學 === 電機工程學研究所 === 102 === Atomic force microscopy (AFM) is a very useful measurement instrument. It can scan the conductive and nonconductive samples and without any restriction in the environments of application. Therefore, it has become an indispensable micro/nano scale measurement to...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2013
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| Online Access: | http://ndltd.ncl.edu.tw/handle/82128708952583223676 |