Study on Reliability of P‐Channel FinFET Devices with Various Dimensions

碩士 === 國立高雄大學 === 電機工程學系碩士班 === 102 === 紙本專利開放日106.07.30

Bibliographic Details
Main Authors: Jia-jian Hong, 洪嘉鍵
Other Authors: Wen-Kuan Yeh
Format: Others
Language:zh-TW
Published: 2014
Online Access:http://ndltd.ncl.edu.tw/handle/12641809287614400066