Application of Lean Six Sigma to improve the yield of TAB process in TFT-LCD JI process
碩士 === 亞洲大學 === 光電與通訊學系碩士在職專班 === 102 === This study applies This study applies the method of LSS (Lean Six Sigma) to improve the yield of TAB (Tape Automated Bonding) in TFT-LCD industry. This research uses a LSS (Lean Six Sigma) basis to Define, Measure, Analyze, Improve and Control (DMAIC) to red...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2014
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| Online Access: | http://ndltd.ncl.edu.tw/handle/74021753138701422131 |