Period Unknown Masking Mechanism with High Fault Coverage
碩士 === 淡江大學 === 電機工程學系碩士班 === 102 === With the recent development of IC testing, IC designs have become more complex and smaller in size. Testing IC is no longer an easy task comparing to before, which inevitably reflects on the increase of testing costs. Unknown value(X) has always been presented i...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2014
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| Online Access: | http://ndltd.ncl.edu.tw/handle/51148932752022372685 |