Test Data Compression Using Compacted 2n Pattern Run-length Codes
碩士 === 元智大學 === 資訊工程學系 === 102 === In traditional testing research for testing VLSI circuits, the larger amounts of test data volume increasing more test time and test cost.This paper is based on Test Data Compression using 2n pattern run-length codes method as the framework to develop a new data co...
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| Format: | Others |
| Language: | zh-TW |
| Online Access: | http://ndltd.ncl.edu.tw/handle/75602476720752880377 |