Applying of PAT test method in the Diode of semiconductor to screen out the potential failure

碩士 === 中華科技大學 === 經營管理研究所 === 103 === The manufacturers of semiconductor devices are often troubled by a problem, that is, although the devices are fabricated strictly in accordance with a standardized operating procedure, which are then followed by various quality monitoring steps, even a 100% chec...

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Bibliographic Details
Main Authors: CHANG, YEN-HUI, 張彥暉
Other Authors: Li-Chun Wu
Format: Others
Language:zh-TW
Published: 2015
Online Access:http://ndltd.ncl.edu.tw/handle/t6rc88