Study on Data Retention of Single-sided NOI MOSFETs under High Temperature Channel Hot Electron Injection
碩士 === 中原大學 === 電子工程研究所 === 103 === Abstract In the semiconductor industry, non-volatile memory (NVM) applications are becoming extensive in various markets. For semiconductor devices development, the improvement of reliability characteristics plays an important role. In this work, we explore the in...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2015
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| Online Access: | http://ndltd.ncl.edu.tw/handle/sptpnv |