Patent Map Analysis for Automatic Defect Detection System of Glass Panels

碩士 === 崑山科技大學 === 電機工程研究所 === 103 === This study focuses on a patent map analysis for automatic defect detection system of glass panels in Taiwan patents, especially on analysis of technical development trends and strategies for optical detection technology of panel defects, panel detection mechanis...

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Bibliographic Details
Main Authors: Yu-Chen Su, 蘇玉真
Other Authors: Ming-Fang Wu
Format: Others
Language:zh-TW
Published: 2015
Online Access:http://ndltd.ncl.edu.tw/handle/10527621729029042212