The RFID Applications for Wafer Testing Automation Process
碩士 === 國立高雄應用科技大學 === 電子工程系碩士班 === 103 === In the traditional semiconductor manufacturing process, the back-end wafer testing processes need more manpower to confirm data and information returns. The production time is exhausted in these processes, which affect and decrease the production profitabil...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2015
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| Online Access: | http://ndltd.ncl.edu.tw/handle/39gzpz |