Analyze for Conical Needle Pogo Vertical Probe Card under Wafer Testing
碩士 === 國立高雄應用科技大學 === 模具工程系 === 103 === The purpose of this research is to discuss about the influence with conical needle pogo vertical probe from the process of the pad. To analyze the element in every parts of concial needle pogo vertical probe, by using scanning electron microscope(SEM) composit...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2015
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| Online Access: | http://ndltd.ncl.edu.tw/handle/xxrr6y |