Application for Taguchi Method in Optimizing Parameter of Ball Pull Test
碩士 === 國立高雄應用科技大學 === 工業工程與管理系碩士在職專班 === 103 === In the process of semiconductor, quality inspection processes are usually performed during manufacturing line. To make sure that the process defect be detected when quality inspection processes performed is engineers’ responsibility. This paper will f...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2015
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| Online Access: | http://ndltd.ncl.edu.tw/handle/14748398136132759204 |