A Study of Defect Detection and Classification Technique for Compact Camera Lens Images
碩士 === 國立中興大學 === 資訊科學與工程學系 === 103 === In the majority of optical related industry, the visual inspection process of the wafer surface depends on human experts. However, the inefficiencies of human visual inspection is has led to the development of image process to perform inspection tasks. Compact...
| Main Authors: | , |
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2015
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| Online Access: | http://ndltd.ncl.edu.tw/handle/2k52dt |