The study of TaOx-based rram bipolar resistive switching process by impedance spectroscopy
碩士 === 國立成功大學 === 材料科學及工程學系 === 103 === Abstract In this study, the resistance switching mechanisms of Ta/TaOx/Pt and Ta/TaOx/ITO devices are explored based on I-V sweeping curves, characteristic impedance and material characteristics. First, TEM is used to investigate the thickness of the device an...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2015
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| Online Access: | http://ndltd.ncl.edu.tw/handle/63zyay |