Mechanism of hysteresis for a-IGZO TFT studied by changing the gate voltage waveform in measurement

碩士 === 國立交通大學 === 光電工程研究所 === 103 === The amorphous indium-gallium-zinc-oxide thin-film transistors can be expected to be applied in the transparent electronics, organic light emission displays and photo sensor for its many advantages. However, the phenomenon of hysteresis is a critical issue in the...

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Bibliographic Details
Main Authors: Chen, Yi-Jung, 陳奕融
Other Authors: Tai, Ya-Hsiang
Format: Others
Language:en_US
Published: 2015
Online Access:http://ndltd.ncl.edu.tw/handle/49836358225103541797