Mechanical property and crystallography of copper thin films and copper nano-twinned pillars

碩士 === 國立交通大學 === 電子物理系所 === 103 === We investigate mechanical properties of copper thin films, the hardness, stiffness and Young’s modulus, in nano-scale using nano-indentation which records load and displacement accurately and simultaneously. . We discuss the creep on the copper thin films which i...

Full description

Bibliographic Details
Main Authors: Yeh, Tzu-Sheng, 葉子聖
Other Authors: Chou, Yi-Chia
Format: Others
Language:zh-TW
Published: 2015
Online Access:http://ndltd.ncl.edu.tw/handle/s49r6a