An Automated Utility with Multi-Checking Mechanism for Physical Verification
碩士 === 國立中央大學 === 電機工程學系在職專班 === 103 === In recent years, the manufacturing process shrinks quickly. The technology node of mass production is achieved 28 nanometer. Due to physical verification (PV) in IC design is one of the important factors affecting the time to tape-out, electronic design autom...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2014
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| Online Access: | http://ndltd.ncl.edu.tw/handle/36521781068987144591 |