Reliability-Driven Placement for Analog Integrated Circuits

碩士 === 國立中央大學 === 電機工程學系 === 103 === Due to the sensitivity of analog components, both post-layout non-ideal effects and reliability are getting important with the size shrink of components. In order to reduce the impact of non-ideal effects on circuit performance and increase the reliability, the l...

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Bibliographic Details
Main Authors: Tsung-Yu Liu, 劉宗祐
Other Authors: Chien-Nan Liu
Format: Others
Language:zh-TW
Published: 2015
Online Access:http://ndltd.ncl.edu.tw/handle/44417826639833164694