Helical Trajectory Design of Multi-Pinhole Micro-SPECT Based on Sampling Completeness
碩士 === 國立中央大學 === 光電科學與工程學系 === 103 === In this study, a sampling completeness evaluation model for pinhole SPECT is proposed based on the Tuy’s condition in cone-beam CT: every plane intersected with the object space should also intersect the sampling orbit at least once. Since the sampling geo...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2015
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| Online Access: | http://ndltd.ncl.edu.tw/handle/63667016177079527690 |