Simulation study of Line Edge Roughness Effects on Inversion-Mode and Junctionless FinFETs

碩士 === 國立東華大學 === 電機工程學系 === 103

Bibliographic Details
Main Authors: Li-Syun Yang, 楊力勳
Other Authors: Keng-Ming Liu
Format: Others
Published: 2015
Online Access:http://ndltd.ncl.edu.tw/handle/94463068758355019341