The effect of thermal annealing on electrical properties of ITO
碩士 === 國立中山大學 === 物理學系研究所 === 103 === This thesis studies the temperature dependence of resistance and uses the Seebeck effect to obtain the carrier concentration in the indium tin oxide (ITO) films which have been annealed. We annealed two sets of indium tin oxide in different temperatures—one thro...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2015
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| Online Access: | http://ndltd.ncl.edu.tw/handle/em3j93 |