Study on the Electric Characteristic Degradation Caused by Negative Bias Illumination Stress for a-InGaZnO4 Thin Film Transistors
碩士 === 國立中山大學 === 電機工程學系研究所 === 103 === With the evolution of modern technology, displays have been an important part in our life and thin film transistor plays a quite crucial role. Metal-oxide thin film transistor has attracted much attention recently since it possesses the advantages of both amor...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2015
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| Online Access: | http://ndltd.ncl.edu.tw/handle/37666629307383722199 |